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Results 1 to 25 of 10286

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Annealing study of ion implanted GaNLIU, C; WENZEL, A; GERLACH, J. W et al.Surface & coatings technology. 2000, Vol 128-29, pp 455-460, issn 0257-8972Conference Paper

Control of substrate surface temperature in millisecond annealing technique using thermal plasma jetOKADA, T; HIGASHI, S; KAKU, H et al.Thin solid films. 2007, Vol 515, Num 12, pp 4897-4900, issn 0040-6090, 4 p.Conference Paper

High quality rapid thermal annealing of InP and GaAs substrates under low pressure tertiarybutylphosphine and tertiarybutylarsine ambientsKATZ, A; FEINGOLD, A; PEARTON, S. J et al.Journal of vacuum science and technology. B. Microelectronics processing and phenomena. 1991, Vol 9, Num 5, pp 2466-2472, issn 0734-211XArticle

Rapid thermal annealing of BF2+ implanted, preamorphized siliconSEIDEL, T. E.IEEE electron device letters. 1983, Vol 4, Num 10, pp 353-355, issn 0741-3106Article

LITHIUM FLUORIDE GLOW-PEAK GROWTH DUE TO ANNEALINGBOOTH LF; JOHNSON TL; ATTIX FH et al.1972; HEALTH PHYS.; G.B.; DA. 1972; VOL. 23; NO 2; PP. 137-142; BIBL. 11 REF.Serial Issue

Diffusion anormalement accélérée de phosphore à partir d'une couche de silicium implantée d'ions sous pressionVASIN, A. S; OKULICH, V. I; PANTELEEV, V. A et al.Fizika i tehnika poluprovodnikov. 1989, Vol 23, Num 3, pp 483-487, issn 0015-3222Article

The effect of pressure on neutron irradiated ammonium chromatesSTAMOULI, M. I.Journal of radioanalytical and nuclear chemistry. 1985, Vol 95, Num 1, pp 21-28, issn 0236-5731Article

Characterization of Y-Ba-Cu-O superconducting thin films prepared by coevaporation of Y, Cu, and BaF2GARZON, F. H; BEERY, J. G; BROWN, D. R et al.Applied physics letters. 1989, Vol 54, Num 14, pp 1365-1367, issn 0003-6951, 3 p.Article

A comparison of defect state densities observed in thermally-annealed hydrogenated amorphous silicon samples after fast or slow cooling ratesGRIMMER, D. P; EPSTEIN, K. A; MISEMER, D. K et al.Photovoltaic specialists conference. 19. 1987, pp 857-862Conference Paper

Study of oxygen related donors in CZ-silicon annealed at 430°C to 630°CPRAKASH, O; SINGH, S.SPIE proceedings series. 1998, pp 652-655, isbn 0-8194-2756-X, 2VolConference Paper

In situ observation by ultrahigh vacuum reflection electron microscopy of terrace formation processes on 1000 silicon surfaces during annealingINOUE, N; YAGI, K.Applied physics letters. 1989, Vol 55, Num 14, pp 1400-1402, issn 0003-6951, 3 p.Article

Diffusion et gettering du chrome dans le silicium dopé au boreZhu, Jin; Barbier, Daniel.1989, 121 p.Thesis

Utilisation du trifluorure de bismuth pour contrôler la pyrohydrolyse des fluorures de métauxARDASHNIKOVA, E. I; BORZEPKOVA, M. P; NOVOSELOVA, A. V et al.Žurnal neorganičeskoj himii. 1986, Vol 31, Num 2, pp 513-515, issn 0044-457XArticle

CHEMICAL CONSEQUENCES OF THERMAL ANNEALING IN NEUTRON ACTIVATED THIOANTIMONY COMPOUNDSFACETTI JF; VALLEJOS A.1972; J. INORG. NUCL. CHEM.; G.B.; DA. 1972; VOL. 34; NO 12; PP. 3659-3664; BIBL. 14 REF.Serial Issue

CHEMICAL EFFECTS OF THE (N,GAMMA ) REACTION IN ALKALI SELENATESAL SIDDIQUE FR; MADDOCK AG.1972; J. INORG. NUCL. CHEM.; G.B.; DA. 1972; VOL. 34; NO 10; PP. 3007-3014; BIBL. DISSEM.Serial Issue

BREVET 2.227.302 (B) (7414510). A 25 AVRIL 1974. PRODUCTION DE PIGMENTS RECUITSsdPatent

THE ROLE OF THE VAPOR IN TRANSFER ANNEALING IN POTASSIUM IODATEHULL DR; OWENS CW.1975; J. INORG. NUCL. CHEM.; G.B.; DA. 1975; VOL. 37; NO 12; PP. 2564-2565; BIBL. 5 REF.Article

ANNEALING OF CHEMICAL RADIATION DAMAGE IN SODIUM CHLORATEDAS BK; MOHANTY SR.1975; INDIAN J. CHEM.; INDIA; DA. 1975; VOL. 13; NO 7; PP. 718-719; BIBL. 7 REF.Article

REACTIVELY HOT-PRESSED YTTRIUM IRON GARNETSBLAIR GR; CHAKLADER ACD; LOW NMP et al.1973; MATER. RES. BULL.; DA. 1973; VOL. 8; NO 2; PP. 161-169; BIBL. 11 REF.Serial Issue

UV INDUCED THERMOLUMINESCENCE ON NATURAL CALCIUM FLUORIDEOKUNO E; WATANABE S.1972; HEALTH PHYS.; G.B.; DA. 1972; VOL. 23; NO 3; PP. 377-382; BIBL. 5 REF.Serial Issue

THE EFFECT OF PRE-STRESSING AND ANNEALING ON THE YOUNG'S MODULUS OF SOME NUCLEAR GRAPHITESETO M; OKU T.1973; J. MATER. NUCL.; PAYS-BAS; DA. 1973; VOL. 46; NO 3; PP. 315-323; ABS. FR. ALLEM.; BIBL. 10 REF.Serial Issue

Annealing and decorating lehr supply optionsGlass international. 2007, Vol 30, Num 4, pp 46-48, issn 0143-7836, 3 p.Article

Thermal processing of GaAsSb/GaAs low-dimensional strained-layer structuresHOMEWOOD, K. P; GILLIN, W. P; PRITCHARD, R. E et al.Superlattices and microstructures. 1990, Vol 7, Num 4, pp 359-361, issn 0749-6036Article

Orientational ordering and site-selective photochemistry of UF6 isolated in argon matricesJONES, L. H; SWANSON, B. I; EKBERG, S. A et al.Journal of physical chemistry (1952). 1984, Vol 88, Num 7, pp 1285-1286, issn 0022-3654Article

Caractérisation électrique d'hétérostructures et de couches minces semiconductrices par effet Hall. I: Superréseaux GaAs/AlAs. II: Silicium sur isolant = Electrical characterization of semiconductivity heterostructures and thin films using Hall effect. I: GaAs/AlAs. II: Silicon on insulatorJeanjean, Philippe; Robert, J. L.1992, 170 p.Thesis

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